Książka Design for Testability, Debug and Reliability Sebastian Huhn

Design for Testability, Debug and Reliability

Next Generation Measures Using Formal Techniques

Język: Angielski
Oprawa: Miękka
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-18 dni
326.51
This book introduces several novel approaches to pave the way for the next generation of integrated...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2022
strony
164
EAN
9783030692117
Enbook ID
38971551
Waga
296
Wymiary
155 x 235 x 11

Pełny opis

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

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