Książka VLSI Test Principles and Architectures Laung-Terng Wang

VLSI Test Principles and Architectures

Język: Angielski
Oprawa: Twarda
Dostępność: Na zamówienie
Wysyłamy za 28-34 dni
348.84
This book is a comprehensive guide to new DFT methods that will show the readers how to design a tes...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2006
strony
808
EAN
9780123705976
ISBN
0123705975
Enbook ID
02703621
Waga
1806
Wymiary
200 x 241 x 51

Pełny opis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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