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Testing Static Random Access Memories

Name: Testing Static Random Access Memories
Brand: Springer-Verlag New York Inc.
SKU: 9781402077524
Price: 424.83 PLN
Availability: InStock

Defects, Fault Models and Test Patterns

Autor: Said Hamdioui

Język:

Oprawa: Twarda

Wydawca: Springer-Verlag New York Inc.

Dostępność: Dostępna u dostawcy

Wysyłamy za 10-13 dni

424.83 zł

"Testing Static Random Access Memories" covers testing of one of the important semiconductor memorie...

Informacje o książce

Autor

Said Hamdioui

Język

Angielski

Oprawa

Książka - Twarda

Data wydania

2004

strony

221

EAN

9781402077524

ISBN

1402077521

Enbook ID

01418168

Wydawca

Springer-Verlag New York Inc.

Waga

1150

Wymiary

155 x 235 x 18

Pełny opis

"Testing Static Random Access Memories" covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

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Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

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