Książka Testing Integrated Circuits Mikhail Itskovich

Testing Integrated Circuits

Język: Angielski
Oprawa: Miękka
Wydawca: Scholars' Press
Dostępność: Dostępna u dostawcy
Wysyłamy za 5-8 dni
175.94
This book teaches how to design and manufacture a testing system for the next generation of integrat...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2014
strony
160
EAN
9783639715873
ISBN
363971587X
Enbook ID
07171064
Wydawca
Waga
245
Wymiary
152 x 229 x 9

Pełny opis

This book teaches how to design and manufacture a testing system for the next generation of integrated circuits. ... The growing efficiency in manufacturing of semiconductor devices combined with increased speed, size and performance of integrated products puts an incredible pressure on testing and verification technology. While negligible in the past, the cost of verification for a modern semiconductor design can be as high as half of the total manufacturing cost. In order to accommodate testing requirements, modern test equipment must operate up to 100 times faster than the state-of-the-art production circuits while using technologies several generations older. ... This book teaches how to test future generations of integrated circuits by using transient currents measured at the power nodes.

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