Książka Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed

Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Język: Angielski
Oprawa: Miękka
Dostępność: Na zamówienie
Wysyłamy za 17-27 dni
207.83
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2012
strony
72
EAN
9783848400355
Enbook ID
07085730
Waga
118
Wymiary
152 x 229 x 4

Pełny opis

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

Możesz być zainteresowany

150.95
42.80

News

Alain de Botton
49.29

Biblioth Que Publique de Gen Ve

Bi Publique Et Universitaire De Gen Ve
49.59

Old Soldier's Memories

S. H. Jones-Parry
194.25
154.39

Klienci, którzy kupili tę książkę, kupili również

30.01

Ashford Park

Lauren Willig
52.34