Książka Stress Induced Phenomena in Metallization Shefford P. Baker

Stress Induced Phenomena in Metallization

Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

Język: Angielski
Oprawa: Twarda
Wydawca: Springer, Berlin
Dostępność: 50 % szansa
Przeszukamy cały świat
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Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a nu...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2002
strony
250
EAN
9780735400580
Enbook ID
01390770
Waga
590
Wymiary
155 x 235

Pełny opis

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.

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