Książka Semiconductor Memory Testing Anuj Gupta

Semiconductor Memory Testing

Fault Models and Test Considerations for High Performance Embedded SRAM's

Autor: Anuj Gupta
Język: Angielski
Oprawa: Miękka
Dostępność: Na zamówienie
Wysyłamy za 17-27 dni
205.41
Stringent test quality requirements, at-speed test limitations & total cost associated with using ex...

Informacje o książce

Autor
Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2009
strony
64
EAN
9783639194401
Enbook ID
06827526
Waga
114
Wymiary
151 x 4 x 10

Pełny opis

Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.

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