Książka Scanning Probe Microscopy Bert Voigtlander

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Język: Angielski
Oprawa: Miękka
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-18 dni
727.20
This book explains the operating principles of atomic force microscopy and scanning tunneling micros...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2016
strony
382
EAN
9783662505571
ISBN
3662505576
Enbook ID
15201769
Waga
6029
Wymiary
155 x 235 x 22

Pełny opis

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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