Książka Scanning Probe Microscopy Bert Voigtländer

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Język: Angielski
Oprawa: Twarda
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-13 dni
849.15
This book explains the principles of operation of scanning force microscopes, scanning tunneling mic...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2015
strony
382
EAN
9783662452394
ISBN
3662452391
Enbook ID
07180362
Waga
746
Wymiary
164 x 245 x 26

Pełny opis

This book explains the principles of operation of scanning force microscopes, scanning tunneling microscopes, and related techniques. The aim of this book is to introduce the reader to scanning probe microscopy in such depth that the reader will be able to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented the by chapters on fundamentals and chapters on important technical aspects. The book applies to master s students from physics, chemistry, materials science, nanoscience and engineering, as well as graduate students and researchers new to the field.§

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