Rough Sets and Knowledge Technology

Name: Rough Sets and Knowledge Technology
Brand: Springer International Publishing AG
SKU: 9783319257532
Price: 212.42 PLN
Availability: InStock

10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings

Autor: Davide Ciucci, Guoyin Wang, Sushmita Mitra, Wei-Zhi Wu

Język:

Oprawa: Miękka

Wydawca: Springer International Publishing AG

Dostępność: Dostępna u dostawcy

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212.42 zł

This book constitutes the thoroughly refereed conference proceedings of the 10th§International Confe...

Informacje o książce

Autor

Davide Ciucci, Guoyin Wang, Sushmita Mitra, Wei-Zhi Wu

Język

Angielski

Oprawa

Książka - Miękka

Data wydania

2015

strony

538

EAN

9783319257532

ISBN

3319257536

Enbook ID

09545758

Wydawca

Springer International Publishing AG

Waga

8307

Wymiary

155 x 235 x 30

Pełny opis

This book constitutes the thoroughly refereed conference proceedings of the 10th§International Conference on Rough Sets and Knowledge Technology, RSKT 2015, held§in Tianjin, China, in November 2015, as part of the International Joint Conference on Rough Sets, IJCRS 2015, together with the 15th International Conference on Rough Sets, Fuzzy Sets, Data Mining and Granular Computing, RSFDgrC 2015. The 66 papers presented at IJCRS 2015 were carefully§reviewed and selected from 97 submissions. The 38 papers included in this volume are organized in the following topical sections: rough sets: the experts speak; reducts and rules; three-way decisions; logic and algebra; clustering; rough sets and graphs; and modeling and learning. In addition the volume contains 6 contributions by new fellows of the International Rough Set Society, an invited talk and a tutorial.

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Rough Sets and Knowledge Technology

10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings

Informacje o książce

Pełny opis

Możesz być zainteresowany

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