Książka Recent Interferometry Applications in Topography and Astronomy Ivan Padron

Recent Interferometry Applications in Topography and Astronomy

Autor: Ivan Padron
Język: Angielski
Oprawa: Twarda
Wydawca: In Tech
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-13 dni
481.83
This book provides a current overview of the theoretical and experimental aspects of some interferom...

Informacje o książce

Autor
Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2012
strony
234
EAN
9789535104049
ISBN
9535104047
Enbook ID
24120246
Wydawca
Waga
572
Wymiary
170 x 244 x 14

Pełny opis

This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.

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