Książka Nonlinear Transistor Model Parameter Extraction Techniques Matthias Rudolph

Nonlinear Transistor Model Parameter Extraction Techniques

Język: Angielski
Oprawa: Twarda
Dostępność: 50 % szansa
Przeszukamy cały świat
662.48
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art te...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2011
strony
366
EAN
9780521762106
ISBN
0521762103
Enbook ID
04385316
Waga
860
Wymiary
179 x 252 x 22

Pełny opis

Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.

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