Książka Noncontact Atomic Force Microscopy Seizo Morita

Noncontact Atomic Force Microscopy

Język: Angielski
Oprawa: Twarda
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-13 dni
853.96
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2002
strony
440
EAN
9783540431176
ISBN
3540431179
Enbook ID
01564043
Waga
912
Wymiary
164 x 241 x 35

Pełny opis

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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