Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Name: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Brand: Springer
SKU: 9780792393061
Price: 470.91 PLN
Availability: InStock

Theory and Computational Models

Autor: José Pineda de Gyvez

Język:

Oprawa: Twarda

Wydawca: Springer

Dostępność: Dostępna u dostawcy w małych ilościach

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The history of this book begins way back in 1982. At that time a research proposal was filed with th...

Informacje o książce

Autor

José Pineda de Gyvez

Język

Angielski

Oprawa

Książka - Twarda

Data wydania

1992

strony

167

EAN

9780792393061

ISBN

0792393066

Enbook ID

05251297

Wydawca

Springer

Waga

1000

Wymiary

155 x 235 x 13

Pełny opis

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Theory and Computational Models

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