Książka High-k/Metal-gate Devices for Future CMOS Technology Stephan Abermann

High-k/Metal-gate Devices for Future CMOS Technology

Język: Angielski
Oprawa: Miękka
Wydawca: VDM Verlag
Dostępność: Dostępna u dostawcy
Wysyłamy za 14-21 dni
297.31
The present work addresses the investigation of§high-? dielectrics and their applicability in§CMOS-d...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2008
strony
180
EAN
9783836465298
ISBN
3836465299
Enbook ID
06854492
Wydawca
Waga
249
Wymiary
152 x 229 x 10

Pełny opis

The present work addresses the investigation of§high-? dielectrics and their applicability in§CMOS-devices, using metal-gate electrodes. The§contents firstly include the deposition of zirconium§dioxide and hafnium dioxide from the gas phase, using§organometallic precursors, and their physico-chemical§characterization. Furthermore, these material systems§are investigated regarding their thermodynamical§stability.§In the following, MOS-capacitors are fabricated by§the selective deposition of gate electrodes made from§aluminum, molybdenum, nickel, or titanium-nitride,§and characterized regarding their electrical behavior. §Results within this work demonstrate that well§balanced and correctly applied annealing of the§devices clearly improves electrical behavior. We§attribute these materials high potential to be§applied in near-future CMOS-technology.

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