Książka Digital System Test and Testable Design Zainalabedin Navabi

Digital System Test and Testable Design

Język: Angielski
Oprawa: Twarda
Dostępność: Dostępna u dostawcy w małych ilościach
Wysyłamy za 13-18 dni
512.87
This book is about digital system testing and testable design. The concepts of testing and testabili...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2010
strony
435
EAN
9781441975478
ISBN
1441975470
Enbook ID
01424239
Waga
2230
Wymiary
178 x 254 x 35

Pełny opis

This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms.§Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

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