Current Approaches in Applied Artificial Intelligence

Name: Current Approaches in Applied Artificial Intelligence
Brand: Springer International Publishing AG
SKU: 9783319190655
Price: 214.72 PLN
Availability: InStock

28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Seoul, South Korea, June 10-12, 2015, Proceedings

Autor: Moonis Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae Kim, Yongdai Kim

Język:

Oprawa: Miękka

Wydawca: Springer International Publishing AG

Dostępność: Dostępna u dostawcy

Wysyłamy za 5-8 dni

214.72 zł

This book constitutes the refereed conference proceedings of the 28th International Conference on In...

Informacje o książce

Autor

Moonis Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae Kim, Yongdai Kim

Język

Angielski

Oprawa

Książka - Miękka

Data wydania

2015

strony

755

EAN

9783319190655

ISBN

3319190652

Enbook ID

09277522

Wydawca

Springer International Publishing AG

Waga

1153

Wymiary

155 x 235 x 41

Pełny opis

This book constitutes the refereed conference proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, held in Seoul, South Korea, in June 2015. The 73 revised full papers presented were carefully reviewed and selected from 105 submissions. The papers cover a wide range of topics in applied artificial intelligence including reasoning, robotics, cognitive modeling, machine learning, pattern recognition, optimization, text mining, social network analysis, and evolutionary algorithms. They are organized in the following topical sections: theoretical AI, knowledge-based systems, optimization, Web and social networks, machine learning, classification, unsupervised learning, vision, image and text processing, and intelligent systems applications.

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Current Approaches in Applied Artificial Intelligence

28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Seoul, South Korea, June 10-12, 2015, Proceedings

Informacje o książce

Pełny opis

Możesz być zainteresowany

Klienci, którzy kupili tę książkę, kupili również