Książka CMOS Test and Evaluation Manjul Bhushan

CMOS Test and Evaluation

A Physical Perspective

Język: Angielski
Oprawa: Twarda
Dostępność: Dostępna u dostawcy
Wysyłamy za 10-13 dni
747.22
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test a...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2014
strony
424
EAN
9781493913480
ISBN
1493913484
Enbook ID
02723226
Waga
802
Wymiary
241 x 163 x 32

Pełny opis

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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