Książka Characterization of Microstructures by Analytical Electron Microscopy (AEM) Yonghua Rong

Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Autor: Yonghua Rong
Język: Angielski
Oprawa: Twarda
Wydawca: Springer, Berlin
Dostępność: 50 % szansa
Przeszukamy cały świat
929.46
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic co...

Informacje o książce

Autor
Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2011
strony
500
EAN
9783642201189
Enbook ID
01657685
Waga
998
Wymiary
155 x 235 x 36

Pełny opis

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. §The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.§Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

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