Książka Arbitrary Modeling of TSVs for 3D Integrated Circuits Khaled Salah

Arbitrary Modeling of TSVs for 3D Integrated Circuits

Język: Angielski
Oprawa: Miękka
Dostępność: Dostępna u dostawcy
Wysyłamy za 5-8 dni
434.14
This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-si...

Informacje o książce

Język
Angielski
Oprawa
Książka - Miękka
Data wydania
2016
strony
179
EAN
9783319374970
ISBN
3319374974
Enbook ID
13633599
Waga
2993
Wymiary
155 x 235 x 11

Pełny opis

This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits. This model accounts for a variety of effects, including skin effect, depletion capacitance and nearby contact effects. Readers will benefit from in-depth coverage of concepts and technology such as 3D integration, Macro modeling, dimensional analysis and compact modeling, as well as closed form equations for the through silicon via parasitics. Concepts covered are demonstrated by using TSVs in applications such as a spiral inductor and inductive-based communication system and bandpass filtering.

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