Anomalous X-Ray Scattering for Materials Characterization

Name: Anomalous X-Ray Scattering for Materials Characterization
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783540434436
Price: 942.15 PLN
Availability: InStock

Atomic-Scale Structure Determination

Autor: Yoshio Waseda

Język:

Oprawa: Twarda

Wydawca: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Dostępność: Dostępna u dostawcy w małych ilościach

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The evolution of our understanding of most properties of new functional materials is related to our...

Informacje o książce

Autor

Yoshio Waseda

Język

Angielski

Oprawa

Książka - Twarda

Data wydania

2002

strony

214

EAN

9783540434436

ISBN

3540434437

Enbook ID

01564214

Wydawca

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Waga

1110

Wymiary

155 x 235 x 20

Pełny opis

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scatte- ring (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.

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Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

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