AI, Machine Learning and Deep Learning
A Security Perspective
Autor:
Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA), Hei, Xiali (University of Louisiana at Lafayette, USA)
Dostępność:
Dostępna u dostawcy
Wysyłamy za 9-15 dni
689.01
zł
Today AI and Machine/Deep Learning have become the hottest areas in the information technology. This...
