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Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer-Verlag New York Inc.
SKU: 9781468476354
Price: 217.33 PLN
Availability: InStock

Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25-27, 1965

Autor: Gavin R. Mallett, Marie Fay, William M. Mueller

Język:

Oprawa: Miękka

Wydawca: Springer-Verlag New York Inc.

Dostępność: Dostępna u dostawcy

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The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented a...

Informacje o książce

Autor

Gavin R. Mallett, Marie Fay, William M. Mueller

Język

Angielski

Oprawa

Książka - Miękka

Data wydania

2012

strony

544

EAN

9781468476354

ISBN

1468476351

Enbook ID

02723066

Wydawca

Springer-Verlag New York Inc.

Waga

1053

Wymiary

178 x 254 x 30

Pełny opis

The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

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Advances in X-Ray Analysis

Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25-27, 1965

Informacje o książce

Pełny opis

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