Książka Advances in Imaging and Electron Physics Peter W. Hawkes

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Język: Angielski
Oprawa: Twarda
Dostępność: Na zamówienie
Wysyłamy za 28-34 dni
877.60
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronic...

Informacje o książce

Język
Angielski
Oprawa
Książka - Twarda
Data wydania
2010
strony
248
EAN
9780123813145
ISBN
012381314X
Enbook ID
04494500
Waga
460
Wymiary
152 x 229 x 18

Pełny opis

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics" and "Electron Physics and Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This title includes contributions from leading international scholars and industry experts. It discusses hot topic areas and presents current and future research trends. It is invaluable reference and guide for physicists, engineers and mathematicians.

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